Sonotron NDT presents on-the-fly defect pattern analysis whilst performing S-Scan material coverage
Sometime it may occur that the dangerous defects do not return the echoes exceeding the threshold level and may not be rejected based on the echo-amplitude evaluation. On the other hand the shape of the inhomogeneity on the cross-sectional image obtained through S-Scan coverage and the echo dynamic analysis may lead to suspecting a crack and rejecting the defect Sonotron NDT‘s portable ultrasonic PA instruments ISONIC 3510, ISONIC 2010, and ISONIC 2009 are featured with the ability of on-the-fly defect pattern analysis whilst observing the live cross-sectional image of the suspected section of the material. The pattern analysis is performed through on-the-fly embedding and implementing additional focal laws into the running sequence with the purpose of receiving and analyzing of complementary echoes from the insonified inhomogeneity. The said complementary signals carry the additional data required for identifying the defect under evaluation. The instrument screen video illustrat